RXT-6402
RXT-6402
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480-RXT-6402_02 (1)
1024-RXT-6402_06
1024-RXT-6402_07
480-RXT-6402_04 (1)

RXT-6402 Dual 400G Multi-service Test Module

Advanced 400GE Test Module, for RXT-1202 Modular Test Platform, in portable hand-held form factor for Field Applications

VeEX® RXT is the industry’s most flexible, compact, and future-proof handheld test solution for transport, core, datacenter, metro, and access. The RXT-6402 Dual 400G all-in-one offers the flexibility of testing all interfaces and rates and future expandability for applications including Transport, Metro, Aggregation, Datacenter inter/intra/cross-connect, Cloud computing, 5G backhaul, and NEMs.

  • 400G Down to 10M Ethernet Testing
  • eCPRI, CPRI & OBSAI
  • Fibre Channel
  • OTN, SDH/SONET, PDH/DSn

 

The RXT-6400 family has been the leading test solution for portable 400G testing, with the RXT-6402 expanding its applications and flexibility. Equipped to support all common optical transceiver form-factors, AOCs and DACs, this module is a perfect complement to the RXT Platform, extending its testing range to form <10M to 400 Gbps and offering a future upgrade path for a single all-in-one 400GE multi-service tester. Installation, verification, commissioning, evaluation, and maintenance tasks are simplified thanks to a combination of intuitive GUI and powerful test functions. Novice users benefit from the easy-to-use GUI, while experienced users will appreciate an array of advanced layer 1-to-4 features, such as FEC codeword Error distribution analysis, PAM4 pre-emphasis, skew, transceiver check and stress, Lane BERT, Throughput test, IPv4/IPv6 and much more.

General

  • Up to four concurrent and independent tests
  • Dual 400G Ethernet testing capabilities.
  • Native QSFP-DD, QSFP56 and SFP-DD PAM4 hardware for best-in-class signal integrity (no adapters required).
  • Provides all the necessary features to test all common form factors, including QSFP-DD, QSFP56, SFP-DD transceivers, DAC, AOCs, fan-out, networking equipment and 400GE links.
  • Advanced and flexible state-of-the-art FPGA-based design provides future-proof hardware support for emerging standards, test functions and applications.
  • Wide range of supported 400GE interfaces.
  • I2C/MDIO registers Read and Write.
  • Per-lane PAM4 pre-emphasis settings.
  • KP4 FEC codeword symbol errors distribution and Skew.
  • Transceivers power consumption monitoring (voltage, current) and variable voltage supply.
  • Internal and external (cage) QSFP-DD temperature monitoring.
  • High-efficiency intelligent cooling system
  • Dedicated QSFP-DD head cooling fans (field replaceable) to extend the transceivers’ lifespan.

Applications

  • Bring-into-service, verification and troubleshooting of high-speed Ethernet links.
  • Optical transceivers, DAC, AOC and fan-out verification.
  • Evaluation labs and field support
  • Comprehensive test applications for layers 1-to-4, from 10M to 400GE.
  • Full rate 400GE Throughput and frame loss measurements.
  • PCS & RS-FEC layer testing.
  • PAM4 signal integrity testing with multi-lane unframed BERT.
  • I2C/MDIO verification and programming.
  • Advanced optical transceiver test.
  • Support for legacy and complementary transmission technologies
  • Portable for field testing, evaluations, demonstrations, interop check, benchmarking, troubleshooting, link verification, etc.
  • Battery power for mobility within large datacenters, nodes, Cos, R&D and evaluation labs.

Test Interfaces

  • 2x QSFP-DD (PAM4)
  • 2x QSFP56/QSFP28/QSFP+ (PAM4/NRZ)
  • 2x SFP-DD/SFP56/SFP28 (PAM4/NRZ)
  • 2x SFP+/SFP (NRZ)
  • 2x RJ45
  • 1x RJ48 and 3x SMA (legacy)
  • 2x Clock Inputs and 2x Outputs

Advanced Optical Transceiver Test Suite

  • Pre-FEC BER validation on a per-lane basis, over operational voltage and frequency offset range to verify optical module integrity before FEC is applied to the PAM4 signal (400GE interfaces).
  • Pre-Framed BER (Lane BERT) validation for non PAM4 interfaces.
  • Voltage, temperature, and Pre-FEC BER are monitored and displayed for the duration of the test. A histogram function clearly displays all three measurements for easy correlation and tracking of any abnormal changes.
  • Pre-FEC BER and Optical Power threshold settings for PASS/FAIL indication.
  • Pre-emphasis: Pre-taps, post-taps, and attenuation settings for PAM4 signal conditioning on the host side to help verify and stress transceiver tolerance and performance.
  • Supply Voltage Tolerance Verification: Sweep range from 3.135V to 3.465V (3.300V +/- 5%) to verify compliance with optical transceiver MSA standard.
  • Power Consumption Verification: Monitors the optical transceiver’s power consumption (Watts), to verify conformance to its specified power class.
  • Temperature Monitoring: QSFP-DD module and cage temperature monitoring with built-in shutdown protection of the optical module if the temperature increases beyond a certain high temperature.
  • Frequency Tolerance Verification: Sweep range from -100 ppm to +100pm (in 0.1ppm/step), to verify compliance with the 400GE IEEE 802.3 +/- 20 ppm tolerance specification.
  • I2C Baud Rate Sweep: QSFP-DD and OSFP sweep range 100K to 4000K. QSFP28 sweep range (20K to 1000K).
  • Stress Test: Pre and Post-FEC Test Suite
  • MDIO Read/Write
  • Optical Power Measurement
  • Transmit Clock Sources
  • Line Frequency Offset Generation and Measurement Capabilities

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