The new RXT-6800 expands testing to 800G for lab and field applications, adding more flexibility to the RXT family. Equipped dual test ports to support all common optical transceiver form- factors, AOCs and DACs, this module is a perfect complement to the RXT Platform, extending its testing range to 800/2×400 Gbps and offering an upgrade path to all-in-one 800GE multi-service testing. Installation, verification, commissioning, evaluation and maintenance tasks are simplified thanks to a combination of intuitive GUI and powerful test functions. Novice users benefit from the easy-to-use GUI, while experienced users will appreciate an array of advanced layer 1-to 4 test features, such as FEC codeword Error distribution analysis, PAM4 pre-emphasis, skew, transceiver check and stress, Lane BERT, Throughput test, IPv4/IPv6 and much more.
As 800GE becomes mainstream, it is important for test equipment to support all test interfaces required to maintain existing legacy infrastructure and data links.
- 800GE PCS/FEC test and 800GE (2x400GE) throughput testing.
- Offers dual ports for all pluggable optics form factors, required for AOC/DAC, fan-out and wrap-around tests (from 10M to 400GE).
- Up to four concurrent and independent tests.
- Native 800G QSFP-DD800, 400G QSFP-DD, QSFP56, SFP DD112, and SFP56 PAM4 hardware for best-in-class signal integrity (no adapters required).
- Supports testing for all common form factors, including QSFP-DD800, QSFP56, SFP-DD, and SFP56 transceivers, DACs, AOCs, and 800GE/400GE network equipment.
- Advanced and flexible state-of-the-art FPGA-based design provides future-proof hardware support for emerging standards, test functions and applications.
- Wide range of supported 400GE interfaces, including 400GBASE-SR8, FR8, LR8, DR4, FR4, LR4, CR8, CR4 and 400ZR/ZR+.
- Complete industry-standard Ethernet link test feature set for Layers 2, 3 and 4.
- I2C/MDIO registers Read and Write.
- Per-lane PAM4 host pre-emphasis settings.
- Signal integrity check with FEC codeword symbol errors distribution and Skew.
- Transceiver power consumption monitoring (voltage, current) and variable voltage supply.
- Dedicated QSFP-DD head cooling fans (field replaceable) to optimize operating temperature verification of high-power class transceivers, such as ZR/ZR+.
- All-in-one solution with common legacy test interfaces.
- Internal and external (cage) QSFP-DD temperature monitoring with overheating protection.
- High-capacity power supply provides support for long range coherent line interface transceivers.
- Battery (backup) operation improves mobility and efficiency in large hyperscale data centers, nodes, COs, R&D, evaluation labs and other field applications.
- High-efficiency intelligent cooling system.
- Full-feature portable hand-held test set form factor, without compromises.