RXT-6402 Dual 400G Multi-Service Test Module
Advanced 2×400GE Multi-Service Handheld Test Set for Lab-to-Field Applications
The RXT-6402 Advanced Dual 400G Multi-service Test Module is a versatile 2×400GE handheld test solution designed for lab-to-field applications across Core, Metro, Datacentre, and Access networks.
Part of the VeEX® RXT platform, it is a compact, future-ready test solution offering flexibility to validate both current and next-generation interfaces. It supports a wide range of use cases including Transport, Aggregation, cross-connect, 5G x-haul, and NEM field deployments.
It enables comprehensive multi-technology testing including 400G down to 10M Ethernet, OTN, SDH/SONET, PDH/DSn, and Fibre Channel.
- Industry-leading portable 400G test solution, extending the RXT-6400 family capabilities
- Dual-port architecture supporting all major optical transceiver form factors, AOCs, and DACs
- Supports up to four concurrent and independent test sessions
- Native support for QSFP-DD, QSFP56, SFP-DD, and SFP56 PAM4 hardware (no adapters required)
- Future-ready FPGA-based architecture for emerging standards and applications
- Supports full range of 400GE interfaces including SR8, FR8, LR8, DR4, FR4, LR4, CR8, CR4, 400ZR/ZR+
- Intuitive GUI for fast setup, testing, and reporting for all user levels
- Advanced Layer 1–4 testing capabilities for validation, troubleshooting, and commissioning
- Designed for lab, field, and hyperscale data centre environments
- High-efficiency cooling system with dedicated QSFP-DD thermal management
- Portable handheld design optimised for mobility and field deployment
- Supports legacy interfaces alongside next-generation 400GE testing
- 2×400GE concurrent testing capability
- Dual-port support for all pluggable optics (AOC/DAC, fan-out, wrap-around tests)
- Supports 10M to 400GE testing range
- Up to four independent and simultaneous test sessions
- Full support for QSFP-DD, QSFP56, SFP-DD, SFP56, DACs, AOCs, and network equipment
- Complete Layer 2, Layer 3, and Layer 4 Ethernet test suite
- I2C/MDIO read and write access
- Per-lane PAM4 host pre-emphasis control
- Signal integrity testing with FEC codeword error distribution and skew analysis
- Transceiver monitoring (voltage, current, power consumption)
- Variable voltage supply support
- Internal and external QSFP-DD temperature monitoring with overheating protection
- Dedicated QSFP-DD cooling fans (field replaceable) for high-power modules (ZR/ZR+)
- High-capacity power system for long-reach coherent transceivers
- Battery backup for mobile field and data centre testing
- Intelligent high-efficiency cooling system
- Full portable handheld design
- Bring-into-service, verification, and troubleshooting of high-speed Ethernet links
- Optical transceiver validation and certification
- DAC and AOC testing with dual-port validation
- Fan-out testing and interoperability checks
- Lab evaluation, field deployment, and benchmarking
- Layer 1–4 network performance testing from 10M to 400GE
- Frame loss, throughput, and full-rate 400GE validation
- PCS & RS-FEC layer testing
- PAM4 signal integrity testing with multi-lane BERT
- I2C/MDIO verification and programming
- Maintenance and troubleshooting of legacy and modern networks
- Interoperability testing and field demonstrations
Test Interfaces
- 2× QSFP-DD (PAM4)
- 2× QSFP56 / QSFP28 / QSFP+ (PAM4 / NRZ)
- 2× SFP-DD / SFP56 / SFP28 (PAM4 / NRZ)
- 2× SFP+ / SFP (NRZ)
- 2× RJ45
- 1× RJ48 and 3× SMA (legacy support)
- 2× Clock Inputs and 2× Clock Outputs
- Four independent test port groups
Additional Interface Notes:
- Balanced ports available in RJ48 or Bantam connector
- Tx1, Rx1, and Rx2 supported (Rx2 may be used for monitoring applications)
PAM4 Interfaces
- Native PAM4 support for QSFP-DD, QSFP56, SFP-DD, SFP56 transceivers
- Supports 400GBASE-SR8, FR8, LR8, DR4, FR4, LR4, CR8, CR4, 400ZR/ZR+
- IEEE 802.3bs and MSA compliant transceivers
- 300W power supply supporting power classes 1–8
- Cage temperature monitoring with overheat protection
- External QSFP-DD cooling system support
- Per-lane pre- and post-emphasis control
- Lane BERT with independent test patterns
Optical Power Measurement
- Global and per-lane transmit enable/disable
- Per-lane and composite optical power monitoring
Transmit Clock Sources
- Internal 2.5 ppm VCXO with optional GPS 1PPS
- Recovered clock from incoming signal
- External reference: 1.544 MHz, 2.048 MHz, 10 MHz, BITS/SETS, 1PPS (50Ω SMA)
Line Frequency Testing
- Line frequency offset generation: ±100 ppm (0.1 ppm steps)
- Frequency measurement in kHz
- Displays offset (min/max/current ppm across lanes)
Stress Test (Pre & Post FEC Suite)
- One-button pass/fail validation
- User-defined thresholds
- Full reporting (settings + results)
- Frequency pulling range stress testing
- Pre-FEC and Post-FEC validation
Advanced Optical Transceiver Test Suite
- Per-lane Pre-FEC BER validation under voltage/frequency stress
- Lane BERT for non-PAM4 interfaces
- Continuous monitoring of voltage, temperature, and BER
- Histogram-based correlation analysis
- Pre-FEC BER and optical power threshold-based pass/fail
- Pre-emphasis tuning (pre/post taps, attenuation control)
- Supply voltage sweep: 3.135V–3.465V
- Power consumption verification (W)
- Temperature monitoring with automatic shutdown protection
- Frequency tolerance sweep: -100 ppm to +100 ppm (0.1 ppm steps)
- I2C baud rate sweep:
- QSFP-DD/OSFP: 100K–4000K
- QSFP28: 20K–1000K
Advanced Test, Measurement & Network Assurance Solutions